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- W2007080377 abstract "In the work are studied structural, electrical and optical properties of film heterojunctions p-Pb<SUB>1-x</SUB>Sn<SUB>x</SUB>Te-n- PbTe obtained by condensation of molecular beams in vacuum approximately 10<SUP>-6</SUP>mm mercury pressure. It is determined that diffusion fringes intensity on diffraction patterns are different depending on thickness of films (d) and temperature of films growing (T<SUB>f</SUB>). The intensity of diffusion fringes also depends on survey temperature (T<SUB>s</SUB>). The correlation between intensity of diffusion fringes on electron diffraction patterns and photosensitivity of heterojunctions Pb<SUB>1-x</SUB>Sn<SUB>x</SUB>Te-PbTe is found." @default.
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- W2007080377 date "2000-11-28" @default.
- W2007080377 modified "2023-09-23" @default.
- W2007080377 title "Structural perfection diagnostics of narrow-gap photosensitive semiconductor junctions by electron diffraction" @default.
- W2007080377 doi "https://doi.org/10.1117/12.407740" @default.
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