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- W2007146827 abstract "The time τ <inf xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>eef</inf> required to establish the Dember electric field <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>E_{D}(t)</tex> following the sudden application or removal of incident light or other radiation is examined in general for large surface recombination velocity and illustrated for fast photoconductive circuit elements. The influence of surface scattering on mobility depends strongly on <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>E_{D}(t)</tex> because E <inf xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>D</inf> results in electrons and holes locating themselves away from the surface. The analysis is subject to the assumptions underlying the ambipolar transport equation and to a single time-constant characterization of the recombination rate. The results show that if τ <inf xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>eff</inf> exceeds other times characteristic of the turn-on or turn-off transient, then it enters importantly into determining the transient observed. Specifically, if the product of the steady-state high injection lifetime, the ambipolar diffusion coefficient, and the square of the absorption coefficient of the incident light greatly exceeds unity, then τ <inf xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>eff</inf> enters importantly. Otherwise it does not." @default.
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- W2007146827 date "1985-11-01" @default.
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- W2007146827 title "Transient establishment of the Dember field in fast photoconductive circuit elements" @default.
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- W2007146827 doi "https://doi.org/10.1109/t-ed.1985.22283" @default.
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