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- W2007279951 abstract "An accurate method for calculating crystallographic orientations from selected area electron diffraction patterns containing spots and Kikuchi lines is described. The accuracy of the method is shown experimentally to be ± 3′ which is compared with the accuracy of other published methods. The method is especially suitable for measuring misorientations across boundaries and it imposes the minimum constraint on the type of pattern that can be analysed. Eine genaue Methode zur Bestimmung kristallographischer Orientierungen aus Elektronen-Beugungsdiagrammen bestimmter Flächen, die Punkte und Kikuchi-Linien enthalten, wird beschrieben. Es wird experimentell gezeigt, daß die Genauigkeit der Methode ± 3′ beträgt, was mit der Genauigkeit anderer publizierter Methoden verglichen wird. Die Methode ist speziell für die Messung von Fehlorientierungen quer durch Grenzflächen geeignet und zeigt die minimale Einschränkung der Typen der Beugungsdiagramme, die analysiert werden können." @default.
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- W2007279951 date "1970-06-16" @default.
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- W2007279951 title "An accurate method for determining crystallographic orientations by electron diffraction" @default.
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- W2007279951 doi "https://doi.org/10.1002/pssa.19700020222" @default.
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