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- W2007331678 abstract "A nondestructive microwave photoconductance technique has been employed to investigate the uniformity of electrical transport properties in semi-insulating, doped, or implanted GaAs. Although the measurement time is increased, the technique is also applicable to Si. A review of the advantages and limitations is discussed and some example applications to a variety of GaAs and Si structures are presented." @default.
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- W2007331678 date "1986-09-01" @default.
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- W2007331678 title "Characterization of GaAs and Si by a microwave photoconductance technique" @default.
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- W2007331678 doi "https://doi.org/10.1063/1.337257" @default.
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