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• W2007367080 abstract "We study the quantum measurement process by a single-electron transistor or a quantum point contact coupled to a quantum bit. We find a unified description of the statistics of the monitored quantity, the current, in the regime of strong measurement and derive the probability distributions for the current and charge in different stages of the process. In the parameter regime of the strong measurement the current develops a telegraph-noise behavior which can be detected in the noise spectrum. This description applies for a wide class of quantum measurements." @default.
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• W2007367080 date "2000-11-20" @default.
• W2007367080 modified "2023-10-17" @default.
• W2007367080 title "Statistics and Noise in a Quantum Measurement Process" @default.
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• W2007367080 doi "https://doi.org/10.1103/physrevlett.85.4578" @default.
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