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- W2007486887 abstract "The Step-Recovery Diode (SRD) frequency multiplier has been studied both theoretically and experimentally. The results show that the multiplier is quite susceptible to neutron damage if self-bias is used (which is usually the case), and it is recommended either that the preradiation lifetime should be deliberately shortened or that voltage bias be considered in a radiation environment. The self-bias problem is found to be due to an increase in recombination current brought on by a reduction in minority carrier lifetime with neutron fluence. This study also derives the ultimate failure fluence as a function of multiplier parameters for these multipliers in general." @default.
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- W2007486887 date "1971-01-01" @default.
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- W2007486887 title "Neutron Damage Effects in Step Recovery Diode Frequency Multipliers" @default.
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- W2007486887 doi "https://doi.org/10.1109/tns.1971.4326455" @default.
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