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- W2007854524 abstract "Using laser assisted atom probe tomography, we investigate the surface recombination processes of a subwavelength Si tip illuminated by an ultrashort laser pulse under high electric field. In practice, by changing the laser wavelength, we demonstrate the presence of a very long electron-phonon relaxation time at the surface. It is experimentally shown that this behavior is common to indirect band gap semiconductors. Furthermore, a simple model is developed in this paper to explain laser wavelength dependence of our experimental results and estimate the surface recombination time." @default.
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- W2007854524 date "2010-08-16" @default.
- W2007854524 modified "2023-09-25" @default.
- W2007854524 title "Surface carrier recombination of a silicon tip under high electric field" @default.
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- W2007854524 doi "https://doi.org/10.1063/1.3473816" @default.
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