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• W2007856217 abstract "A model is developed of field (tunnel) generation of positive charge in thermal silicon dioxide of SiSiO2 structures under high electric field condition. The main characteristics of accumulated charge, i.e. kinetic ΔUFB(t), depth and current–time dependences, and others are numerically simulated. It is shown that the model satisfactorily explains some experimentally observed facts and the mechanism of tunnel ionization must be taken into account, when charge accumulation in dielectrics under high field condition is investigated. [Russian Text Ignored]." @default.
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• W2007856217 date "1985-12-16" @default.
• W2007856217 modified "2023-09-26" @default.
• W2007856217 title "A model of field (tunnel) generation of positive charge in thermal silicon dioxide of SiSiO2 structures" @default.
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• W2007856217 doi "https://doi.org/10.1002/pssa.2210920236" @default.
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