Matches in SemOpenAlex for { <https://semopenalex.org/work/W2008007545> ?p ?o ?g. }
- W2008007545 endingPage "1087" @default.
- W2008007545 startingPage "1058" @default.
- W2008007545 abstract "Results of a Monte Carlo study of carrier multiplication in silicon bipolar and field-effect transistors and of electron injection into silicon dioxide are presented. Qualitative and, in most cases, quantitative agreement is obtained only by accounting for the correct band structure, all relevant scattering processes (phonons, Coulomb, impact ionization), and the highly nonlocal properties of electron transport in small silicon devices. In addition, it is shown that quantization effects in inversion layers cause a shift of the threshold energy for impact ionization which is very significant for the calculation of the substrate current in field-effect transistors. Conservation of parallel momentum, image-force corrections, dynamic screening of the interparticle Coulomb interaction, and improvements to the WKB approximation are necessary to treat correctly the injection of electrons from silicon into silicon dioxide. The validity of models—analytic or Monte Carlo—which treat hot-electron transport with oversimplified physical approximations is argued against. In a few words, there is no shortcut." @default.
- W2008007545 created "2016-06-24" @default.
- W2008007545 creator A5018269073 @default.
- W2008007545 creator A5040713914 @default.
- W2008007545 creator A5058712067 @default.
- W2008007545 date "1995-07-15" @default.
- W2008007545 modified "2023-10-01" @default.
- W2008007545 title "Understanding hot-electron transport in silicon devices: Is there a shortcut?" @default.
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- W2008007545 doi "https://doi.org/10.1063/1.360340" @default.
- W2008007545 hasPublicationYear "1995" @default.
- W2008007545 type Work @default.
- W2008007545 sameAs 2008007545 @default.