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• W2008186816 abstract "The role of lateral interconnections between three-dimensional pentacene islands on low surface energy polyimide gate dielectrics was investigated by the measurement of the surface coverage dependence of the charge mobility and the use of conducting-probe atomic force microscopy (CP-AFM). From the correlation between the electrical characteristics and the morphological evolution of the three-dimensionally grown pentacene films-based field-effect transistors, we found that during film growth, the formation of interconnections between the three-dimensional pentacene islands that are isolated at the early stage contributes significantly to the enhancement process of charge mobility. The CP-AFM current mapping images of the pentacene films also indicate that the lateral interconnections play an important role in the formation of good electrical percolation pathways between the three-dimensional pentacene islands." @default.
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• W2008186816 date "2006-09-12" @default.
• W2008186816 modified "2023-09-23" @default.
• W2008186816 title "Enhanced Electrical Percolation Due to Interconnection of Three-Dimensional Pentacene Islands in Thin Films on Low Surface Energy Polyimide Gate Dielectrics" @default.
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• W2008186816 doi "https://doi.org/10.1021/jp0646527" @default.
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