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- W2008247132 abstract "The dynamics of a phase defect (P-defect) on the Si(100) surface was studied for the first time by scanning tunneling microscopy in pseudo-real time below 10K, using the repeated-line-scan technique in which single line scans are repeated on the same path along a dimer row. In addition to the pair creation and annihilation of the P-defect, the effect of a step on the motion of the P-defect was clearly demonstrated. Since the local barrier height for the migration of the P-defect depends on the local environment such as strain and electronic structure due to the existence of defects or dopants, the obtained results also indicate that analysis of the P-defect is promising for local probing of the Si(100) surface." @default.
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- W2008247132 date "2002-07-30" @default.
- W2008247132 modified "2023-09-23" @default.
- W2008247132 title "Pseudo-Real Time Observation of the Dynamics of Phase Defect on Si(100) Surface" @default.
- W2008247132 doi "https://doi.org/10.1143/jjap.41.5017" @default.
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