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• W2008359969 abstract "From the inception of analytical mass spectrometry numerous efforts have been undertaken to minimize artifacts in mass spectra. While double-focusing techniques brought about significant progress in that interference signals in ionsource mass spectra can now be excluded, for MS/MS studies several kinds of artifacts exist when only two sectors are used in MSn (n ⩾ 2) experiments. Tandem mass spectrometers having more than two sectors provide the possibility of mass-selecting parent ions under high resolution conditions and thus one might assume that artifact signals can be avoided in these machines. However, this is simply not true, and in this paper we describe possible sources of interference signals in a tandem mass spectrometer of BEBE configuration; similar considerations apply for other configurations of large-scale mass spectrometers as well. Artifact signals will be discussed which originate from limited parent-ion and/or daughter-ion resolution, from fragmentation processes occurring within the analyzers, and of interference signals which can be traced back to other sources." @default.
• W2008359969 created "2016-06-24" @default.
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• W2008359969 creator A5089799048 @default.
• W2008359969 date "1995-08-01" @default.
• W2008359969 modified "2023-10-03" @default.
• W2008359969 title "Interference signals in “third-generation” BEBE sector field mass spectrometers" @default.
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• W2008359969 doi "https://doi.org/10.1016/0168-1176(95)04195-q" @default.
• W2008359969 hasPublicationYear "1995" @default.
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