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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2008441405> ?p ?o ?g. }

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• W2008441405 abstract "We investigated the reversible electromigration in Pd-Pt nanobridges by means of in situ electron microscopy. Real-time nanometer-scale imaging with scanning transmission electron microscopy was used to determine the material transport. For high current densities (3-5 × 10(7) A cm(-2)), material transport occurs from the cathode towards the anode side, indicating a negative effective charge. The electromigration is dominated by atom diffusion at grain boundaries on the free surface. The reversal of material transport upon a change of the electric field direction could be the basis of a memristor." @default.
• W2008441405 created "2016-06-24" @default.
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• W2008441405 date "2013-11-22" @default.
• W2008441405 modified "2023-09-23" @default.
• W2008441405 title "<i>In situ</i>TEM and STEM studies of reversible electromigration in thin palladium–platinum bridges" @default.
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• W2008441405 doi "https://doi.org/10.1088/0957-4484/24/50/505708" @default.
• W2008441405 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/24270041" @default.
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