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• W2008548652 abstract "Validating the robustness of power distribution in modern IC design is a crucial but very difficult problem, due to the vast number of possible working modes and the high operating frequencies which necessitate the modeling of power grid as a general RLC network. In this paper we provide a characterization of the worst-case current waveform excitations that produce the maximum voltage drop among all possible working modes of the IC. In addition, we give a practical methodology to estimate these worst-case excitations on the basis of a sample of the excitation space acquired via plain circuit simulation. In the course of characterizing the worst-case excitations we also establish that the voltage drop function for RLC grid models has nonnegative coefficients, which has been an open problem so far." @default.
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• W2008548652 date "2010-11-07" @default.
• W2008548652 modified "2023-09-28" @default.
• W2008548652 title "Characterization of the worst-case current waveform excitations in general RLC-model power grid analysis" @default.
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• W2008548652 doi "https://doi.org/10.5555/2133429.2133600" @default.
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