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- W2009465052 abstract "This paper presents a new pseudo-exhaustive testing algorithm that is composed of the path sensitization and sub-circuit partitioning using <i>t</i>-distribution. In the proposed testing algorithm, the paths, for the path sensitization the, between PIs and POs based on the high TMY (test-mainstay) nodes of CUT are sensitized and the boundary nodes, for the partitioned sub-circuits, are defined on the level of significance α on <i>t</i>-distribution respectively. As a consequence, when (1-α) is 0.2368, the most suitable of the performance to operate the singular cover and consistency operation in the path sensitization. And when the α is 0.5217, the most suitable of the performance to partition the sub-circuit in sub-circuit partitioning." @default.
- W2009465052 created "2016-06-24" @default.
- W2009465052 creator A5057214296 @default.
- W2009465052 date "2004-03-30" @default.
- W2009465052 modified "2023-09-26" @default.
- W2009465052 title "Pseudo-exhaustive testing using t-distribution" @default.
- W2009465052 doi "https://doi.org/10.1117/12.530135" @default.
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