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• W2009557890 abstract "A review of the literature on single-event radiation effects (SEE) on MOS integrated-circuit dynamic random access memories (DRAMs) is presented. The sources of single-event (SE) radiation particles, causes of circuit information loss, experimental observations of SE information upset, technological developments for error mitigation, and relationships of developmental trends to SE vulnerability are discussed." @default.
• W2009557890 created "2016-06-24" @default.
• W2009557890 creator A5081834179 @default.
• W2009557890 date "1996-04-01" @default.
• W2009557890 modified "2023-10-03" @default.
• W2009557890 title "Cosmic and terrestrial single-event radiation effects in dynamic random access memories" @default.
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• W2009557890 doi "https://doi.org/10.1109/23.490902" @default.
• W2009557890 hasPublicationYear "1996" @default.
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