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- W2009789318 abstract "In this article we propose constraint based test generation as a new method for Automatic Test Pattern Generation (ATPG) in digital circuits, and describe a framework which makes it possible to uniquely handle a set of problems in currently existing ATPG methods, like the question of functional circuit modelling or the topological parallelization of the ATPG algorithm. The stated constructs (object oriented data-flow networks, the internal representation of network elements by dynamic binary constraint networks, the use of arc consistency algorithms, careful scheduling and a special dependency directed backtracking scheme) result in a high representational power and fast operating speed. Main concepts and reasons for decisions are shown before the details of a system architecture is presented." @default.
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- W2009789318 date "1993-09-01" @default.
- W2009789318 modified "2023-10-18" @default.
- W2009789318 title "Automatic test pattern generation can be solved as a constraint satisfaction problem" @default.
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- W2009789318 doi "https://doi.org/10.1016/0165-6074(93)90216-8" @default.
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