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- W2010330068 abstract "Abstract The radiofrequency sputtering technique has been used to deposit LiNbO3 thin films onto 〈1 1 1〉 Si, In2O3:Sn-coated 〈1 1 1〉 Si and amorphous SiO2 substrates. In essence, such as-grown composite structures are polycrystalline and exhibit columnar morphologies. To extend the classical macroscopic characterizations, we report on high-resolution inspection methods at the nanometric scale, involving atomic force microscopy in both non-contact and contact modes, that confirm the ferroelectric behavior of such as-deposited films." @default.
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- W2010330068 date "2004-08-01" @default.
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- W2010330068 title "Growth and nanoscale ferroelectric investigation of radiofrequency-sputtered LiNbO3 thin films" @default.
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- W2010330068 doi "https://doi.org/10.1016/j.matchemphys.2004.03.018" @default.
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