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• W2010579306 abstract "A computation is performed of the constant force lines and profiles of the lateral force component when scanning the atomic force microscope tip in contact mode above a close-packed surface, containing a vacancy type defect with allowance for the displacements of the surface atoms. Three different scanning regimes are investigated which may exist for the different values of the scanning force: without modification of the surface, with a single jump of the defect in opposition to the scanning direction, and with a dragging of a vacancy behind a tip. It is shown that by the lines of constant force one may conclude what regime is actually realized, and that by the profiles of the lateral force component one may estimate quantitatively the value of the vacancy migration energy." @default.
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• W2010579306 date "1998-04-01" @default.
• W2010579306 modified "2023-09-23" @default.
• W2010579306 title "The Feasibility of Determining Vacancy Migration Energy by Atomic Force Microscopy Data" @default.
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• W2010579306 doi "https://doi.org/10.1142/s0218625x98000943" @default.
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