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- W2010614529 abstract "Abstract The equipment concept described in this paper is concerned with the environmental cycling of modular electronic and electro-mechanical assemblies, with the prime objectives of precipitating “infant mortality” failures, and the identification of potential operational failure modes within the span of the development phase. An extension of the FRAM concept of increasing importance is on the completion of the “burn-in” cycle and to continue testing for further number of cycles in order to acquire sufficient cumulative test time to satisfy the requirements of any specified reliability demonstration trial. In its four-year period of extensive use FRAM has proven to be both technically and economically effective." @default.
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- W2010614529 date "1972-04-01" @default.
- W2010614529 modified "2023-09-27" @default.
- W2010614529 title "FRAM Failure rate appraisal machine An outline of its concept and application" @default.
- W2010614529 doi "https://doi.org/10.1016/0026-2714(72)90701-9" @default.
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