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• W2010985616 abstract "This paper presents a multilevel fault simulator for digital circuits. Single and multiple transient phenomena are examined at low level in order to model accurately single/multiple event transients at logic level. Multilevel simulation is used for precision of electrical modeling and the conciseness of the coarse grain gate-level modeling. This simulator handles natural and maliciously induced transient faults, allowing evaluating the robustness of dependable circuits as well as countermeasures against ionizing-induced fault attacks on secure circuits." @default.
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• W2010985616 date "2013-11-02" @default.
• W2010985616 modified "2023-09-24" @default.
• W2010985616 title "Multilevel Ionizing-Induced Transient Fault Simulator" @default.
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• W2010985616 doi "https://doi.org/10.1080/19393555.2014.891280" @default.
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