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• W2012132551 abstract "The mechanical stability of nanocrystal films is critical for applications, yet largely unexplored. Raman microprobe analysis used here to probe the nanocrystal cores of thick, fractured electrophoretically deposited films of 3.2 nm diameter CdSe nanocrystals measures ∼2.5% in-plane tensile strain in cores of unfractured films. The crack dimensions determine the overall in-plane film strain, ∼11.7%, and the film biaxial modulus, ∼13.8 GPa, from which the biaxial modulus of the trioctylphosphine oxide ligand matrix is inferred, ∼5.1 GPa." @default.
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• W2012132551 date "2005-12-17" @default.
• W2012132551 modified "2023-10-14" @default.
• W2012132551 title "Raman Microprobe Analysis of Elastic Strain and Fracture in Electrophoretically Deposited CdSe Nanocrystal Films" @default.
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• W2012132551 doi "https://doi.org/10.1021/nl051921g" @default.
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