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• W2012326980 abstract "This work extends a general method used to test classical circuits to quantum circuits. Gate internal errors are address using a discrete fault model. Fault models to represent unwanted nearest neighbor entanglement as well as unwanted qubit rotation are presented. When witnessed, the faults we model are probabilistic, but there is a set of tests with the highest probability of detecting a discrete repetitive fault. A method of probabilistic set covering to identify the minimal set of tests is introduced. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies for quantum networks." @default.
• W2012326980 created "2016-06-24" @default.
• W2012326980 creator A5079523895 @default.
• W2012326980 date "2005-01-01" @default.
• W2012326980 modified "2023-09-25" @default.
• W2012326980 title "Automated Test Pattern Generation for Quantum Circuits" @default.
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• W2012326980 doi "https://doi.org/10.15760/mcnair.2005.38" @default.
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