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- W2012368800 startingPage "2699" @default.
- W2012368800 abstract "Absolute cross sections for electron impact single ionization of O + , S + and S 2+ ions have been measured at an electron impact energy range from below threshold to 1000 eV, using the crossed beam technique. The measured cross sections for O + ions are reproduced quite well with the semiempirical Lotz formula over the whole energy range investigated. The measured cross sections for S + and S 2+ ions show a more rapid rise from the threshold to their peak than those expected from the Lotz formula. For S 2+ ions, another small bump beginning at 120 eV is observed, where no level exists that may contribute to any direct or indirect ionization processes." @default.
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- W2012368800 date "1988-08-15" @default.
- W2012368800 modified "2023-10-06" @default.
- W2012368800 title "Electron Impact Ionization of O<sup>+</sup>, S<sup>+</sup>and S<sup>2+</sup>Ions" @default.
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- W2012368800 doi "https://doi.org/10.1143/jpsj.57.2699" @default.
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