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• W2013110110 abstract "We investigated the change in Si surface recombination behaviour during the electrodeposition of ultrathin polypyrrole (PPy) films onto Si surfaces by means of in-situ pulsed photoluminescence (PL) spectroscopy. The quenching of the band-gap related PL is lower (better passivation) when the electrodeposition is performed in a less acidic solution by use of potential pulse sequences. In-situ infrared spectroscopic ellipsometry (IR-SE) was applied for the first time to PPy electrodeposition. IR-SE and PL measurements confirm negligible formation of SiOx species at the Si/PPy interface although aqueous electrolytes were used." @default.
• W2013110110 created "2016-06-24" @default.
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• W2013110110 date "2008-01-22" @default.
• W2013110110 modified "2023-10-14" @default.
• W2013110110 title "Recombination Behaviour at the Ultrathin Polypyrrole Film/Silicon Interface Investigated by<i>In-situ</i>Pulsed Photoluminescence" @default.
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• W2013110110 doi "https://doi.org/10.1143/jjap.47.554" @default.
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