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• W2013132489 endingPage "14519" @default.
• W2013132489 startingPage "14510" @default.
• W2013132489 abstract "Cluster secondary ion mass spectrometry (cluster SIMS) has been proven to be a useful technique for the surface and in-depth characterization of molecular films. In this study, an SF5+ polyatomic primary ion source is utilized for depth profiling in poly(methyl methacrylate) (PMMA) bulk and thin films (200 nm). The effects of SF5+ ion beam energy are discussed in detail. Both 5 and 8 keV ion beam energies are utilized for depth profiling experiments, where the chemistry of sputtering is investigated using surface analytical tools such as X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) in conjunction with SIMS. Thin film depth profiles acquired with 5 keV SF5+ display evidence of significant damage accumulation at the interface in the form of a highly cross-linked polymer gel. There is very little evidence of similar damage accumulation at the interface for the corresponding 8 keV SF5+depth profile. AFM and XPS analysis of the sputtered crater bottoms also indicates that very different chemistries and morphologies are present at the interface when employing 5 keV vs 8 keV SF5+. For PMMA bulk samples, greater erosion depths were achieved when employing higher beam energies, similar to what has been observed previously with C60n+ depth profiling.(1) These increased erosion depths are attributed to the increased sputter rates of the PMMA at 8 keV SF5+ as compared to 5 keV SF5+, thus allowing for increased amounts of material to be removed prior to the approach of the gel point of the PMMA (dose at which a 3-D cross-linked structure is formed). Despite these increased erosion depths, the 8 keV SF5+ beam imparts greater initial structural damage, as indicated by decreased C═O contents in the C1s XPS spectra and increased amounts of graphitic type peaks in the corresponding SIMS spectra. Overall, the results indicate that, for thicker samples, one should employ higher beam energies for optimum results. However, for thinner films, in which the gel effect does not play a significant role, lower beam energies are preferred." @default.
• W2013132489 created "2016-06-24" @default.
• W2013132489 creator A5010950046 @default.
• W2013132489 creator A5023201240 @default.
• W2013132489 creator A5027862691 @default.
• W2013132489 date "2010-08-11" @default.
• W2013132489 modified "2023-09-27" @default.
• W2013132489 title "Investigation of Damage Mechanisms in PMMA during ToF-SIMS Depth Profiling with 5 and 8 keV SF₅⁺ Primary Ions" @default.
• W2013132489 cites W1963704262 @default.
• W2013132489 cites W1965764203 @default.
• W2013132489 cites W1969799060 @default.
• W2013132489 cites W1970098894 @default.
• W2013132489 cites W1978141712 @default.
• W2013132489 cites W1984793224 @default.
• W2013132489 cites W1987027212 @default.
• W2013132489 cites W1998140338 @default.
• W2013132489 cites W2006067011 @default.
• W2013132489 cites W2006459744 @default.
• W2013132489 cites W2006851850 @default.
• W2013132489 cites W2009588699 @default.
• W2013132489 cites W2012780023 @default.
• W2013132489 cites W2013601228 @default.
• W2013132489 cites W2023044103 @default.
• W2013132489 cites W2046849794 @default.
• W2013132489 cites W2049285151 @default.
• W2013132489 cites W2053828943 @default.
• W2013132489 cites W2055375224 @default.
• W2013132489 cites W2055757200 @default.
• W2013132489 cites W2059480008 @default.
• W2013132489 cites W2061864283 @default.
• W2013132489 cites W2075875601 @default.
• W2013132489 cites W2076596830 @default.
• W2013132489 cites W2082369582 @default.
• W2013132489 cites W2090936981 @default.
• W2013132489 cites W2111380793 @default.
• W2013132489 cites W2133289332 @default.
• W2013132489 cites W2141585693 @default.
• W2013132489 cites W2143361686 @default.
• W2013132489 cites W2151993859 @default.
• W2013132489 cites W2162506410 @default.
• W2013132489 doi "https://doi.org/10.1021/jp103938y" @default.
• W2013132489 hasPublicationYear "2010" @default.
• W2013132489 type Work @default.
• W2013132489 sameAs 2013132489 @default.
• W2013132489 citedByCount "9" @default.
• W2013132489 countsByYear W20131324892012 @default.
• W2013132489 countsByYear W20131324892013 @default.
• W2013132489 countsByYear W20131324892014 @default.
• W2013132489 countsByYear W20131324892016 @default.
• W2013132489 countsByYear W20131324892017 @default.
• W2013132489 countsByYear W20131324892018 @default.
• W2013132489 crossrefType "journal-article" @default.
• W2013132489 hasAuthorship W2013132489A5010950046 @default.
• W2013132489 hasAuthorship W2013132489A5023201240 @default.
• W2013132489 hasAuthorship W2013132489A5027862691 @default.
• W2013132489 hasConcept C113196181 @default.
• W2013132489 hasConcept C121332964 @default.
• W2013132489 hasConcept C145148216 @default.
• W2013132489 hasConcept C162356407 @default.
• W2013132489 hasConcept C171250308 @default.
• W2013132489 hasConcept C175708663 @default.
• W2013132489 hasConcept C178790620 @default.
• W2013132489 hasConcept C185592680 @default.
• W2013132489 hasConcept C187529661 @default.
• W2013132489 hasConcept C19067145 @default.
• W2013132489 hasConcept C192562407 @default.
• W2013132489 hasConcept C22423302 @default.
• W2013132489 hasConcept C43617362 @default.
• W2013132489 hasConcept C46141821 @default.
• W2013132489 hasConcept C50774322 @default.
• W2013132489 hasConcept C77671233 @default.
• W2013132489 hasConceptScore W2013132489C113196181 @default.
• W2013132489 hasConceptScore W2013132489C121332964 @default.
• W2013132489 hasConceptScore W2013132489C145148216 @default.
• W2013132489 hasConceptScore W2013132489C162356407 @default.
• W2013132489 hasConceptScore W2013132489C171250308 @default.
• W2013132489 hasConceptScore W2013132489C175708663 @default.
• W2013132489 hasConceptScore W2013132489C178790620 @default.
• W2013132489 hasConceptScore W2013132489C185592680 @default.
• W2013132489 hasConceptScore W2013132489C187529661 @default.
• W2013132489 hasConceptScore W2013132489C19067145 @default.
• W2013132489 hasConceptScore W2013132489C192562407 @default.
• W2013132489 hasConceptScore W2013132489C22423302 @default.
• W2013132489 hasConceptScore W2013132489C43617362 @default.
• W2013132489 hasConceptScore W2013132489C46141821 @default.
• W2013132489 hasConceptScore W2013132489C50774322 @default.
• W2013132489 hasConceptScore W2013132489C77671233 @default.
• W2013132489 hasIssue "34" @default.
• W2013132489 hasLocation W20131324891 @default.
• W2013132489 hasOpenAccess W2013132489 @default.
• W2013132489 hasPrimaryLocation W20131324891 @default.
• W2013132489 hasRelatedWork W1967790497 @default.
• W2013132489 hasRelatedWork W1990837457 @default.
• W2013132489 hasRelatedWork W2014609009 @default.
• W2013132489 hasRelatedWork W2019028373 @default.
• W2013132489 hasRelatedWork W2035848439 @default.
• W2013132489 hasRelatedWork W2081395095 @default.
• W2013132489 hasRelatedWork W2321729824 @default.

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