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- W2013187031 abstract "This paper provides an overview of chip-level failure mechanisms and test screens. Emphasis is placed on detectability of defect mechanisms by chip-level test, trends that affect failure mechanisms and screens, and resulting implications for system-level yield and reliability." @default.
- W2013187031 created "2016-06-24" @default.
- W2013187031 creator A5026865205 @default.
- W2013187031 date "2010-11-07" @default.
- W2013187031 modified "2023-09-26" @default.
- W2013187031 title "System-level impact of chip-level failure mechanisms and screens" @default.
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- W2013187031 doi "https://doi.org/10.5555/2133429.2133464" @default.
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