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• W2013280482 abstract "A soft X-ray ptychography approach can now image 5-nm-sized objects. Chemical component distributions in the delithiation of LiFePO4 nanoplates — a process relevant for energy storage — links structural defects to chemical phase propagation. X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic and bond orientation contrast1,2,3,4,5. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the X-ray optics6,7,8,9,10. Here, using soft X-ray ptychography, we demonstrate the highest-resolution X-ray microscopy ever achieved by imaging 5 nm structures. We quantify the performance of our microscope and apply the method to the study of delithiation in a nanoplate of LiFePO4, a material of broad interest in electrochemical energy storage11,12. We calculate chemical component distributions using the full complex refractive index and demonstrate enhanced contrast, which elucidates a strong correlation between structural defects and chemical phase propagation. The ability to visualize the coupling of the kinetics of a phase transformation with the mechanical consequences is critical to designing materials with ultimate durability." @default.
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• W2013280482 date "2014-09-07" @default.
• W2013280482 modified "2023-10-06" @default.
• W2013280482 title "Chemical composition mapping with nanometre resolution by soft X-ray microscopy" @default.
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• W2013280482 doi "https://doi.org/10.1038/nphoton.2014.207" @default.
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