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• W2013562125 abstract "Single particle displacement damage events are reported in silicon diodes irradiated with <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>252</sup> Cf and <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>241</sup> Am. In situ measurements of reverse current show the result of displacement damage incurred from individual fission fragments in <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>252</sup> Cf irradiated diodes. Discrete increases in reverse current exceeding 20 fA are measured. The increases are temporally correlated with fission fragment-induced ionization events. The ratio of the damage factor associated with fission fragments to the damage factor associated with alpha particles is in good agreement with the ratio of non-ionizing energy loss calculated for fission fragments to NIEL calculated for alpha particles." @default.
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• W2013562125 date "2012-12-01" @default.
• W2013562125 modified "2023-10-06" @default.
• W2013562125 title "Single Particle Displacement Damage in Silicon" @default.
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• W2013562125 doi "https://doi.org/10.1109/tns.2012.2224131" @default.
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