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- W2013880845 abstract "There are many facets and features to applying the processes of reliability, availability, and maintainability (RAM) engineering during the lifecycle of a system. None are more important than the methodical, intentional application of modeling and simulation upfront in the design of a system to ensure that requirements are met. This paper presents and discusses solutions that demonstrate the practical application of complex modeling and how this process applies practically using real-world examples such as chemical manufacturing plants and space-borne systems. Many large manufacturing or development organizations are driven by costs of development and real-time maintenance and not seeking long term value by planning a system to be more reliable, and thus creating value by reducing cost of operation and ownership. RAM Simulation and Modeling is a process employed by RAM engineers for predicting performance of a system in order to drive value through reliability gap analysis, and project development as examples. The authors will demonstrate, through practical examples, how application of the RAM modeling has been applied to create maximum value to both Government entities and commercial companies alike. Modeling and simulation have been employed throughout all phases of the lifecycle of new system development (new plant designs, existing facilities improvements, integrated site design, spacecraft development, and maintenance task analysis) and have delivered value in the form of lower cost of operation, improved availability of the system, and value to corporate bottom lines. The authors will also demonstrate how reliability engineers have successfully provided value to design teams by helping them identify failure modes and mitigate them, thus improving the systems that they support." @default.
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- W2013880845 date "2010-01-01" @default.
- W2013880845 modified "2023-09-27" @default.
- W2013880845 title "Applying discrete event modeling in the real world" @default.
- W2013880845 doi "https://doi.org/10.1109/rams.2010.5448012" @default.
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