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• W2014022260 abstract "This paper presents a deterministic dynamic element matching (DDEM) approach, which is applied to low-precision digital-to-analog converters (DACs) to generate uniformly spaced voltage samples for analog-to-digital converter (ADC) testing. Theoretical analysis is provided to show the test performance using this DDEM DAC. Both simulation results and experimental results from a fabricated DDEM DAC are presented to verify the performance. The ADC testing performance, by using an 8-bit DDEM DAC (linearity less than 5 bits without DDEM), is comparable to the best results reported in the literature using on-chip linear ramp generators. The DDEM technique offers great potential for use in both production test and built-in-self-test (BIST) environments." @default.
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• W2014022260 date "2007-10-01" @default.
• W2014022260 modified "2023-09-24" @default.
• W2014022260 title "Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs" @default.
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• W2014022260 doi "https://doi.org/10.1109/tim.2007.903621" @default.
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