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- W2014161575 abstract "In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure sites before destructive physical analysis of the degraded limiters." @default.
- W2014161575 created "2016-06-24" @default.
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- W2014161575 date "2014-05-01" @default.
- W2014161575 modified "2023-09-24" @default.
- W2014161575 title "Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter" @default.
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- W2014161575 doi "https://doi.org/10.1016/j.microrel.2014.01.009" @default.
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