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- W2014239105 abstract "The authors have developed an optical delay tester based on electro-optic sampling, and designed a prototype to test the timing of high-speed IC chips. The device puts an electro-optic crystal in contact with the terminals to be tested and measures the voltage waveform applied to the crystal. Measurement precision is 100 mV or better and timing precision measurement is 50 ps." @default.
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- W2014239105 date "1991-08-01" @default.
- W2014239105 modified "2023-09-23" @default.
- W2014239105 title "<title>Optical delay tester</title>" @default.
- W2014239105 doi "https://doi.org/10.1117/12.44538" @default.
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