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• W2014417962 abstract "High test quality can be achieved through defect oriented testing using analog fault modeling approach. However, this approach is computationally demanding and typically hard to apply to large scale circuits. In this work, we use an improved inductive fault analysis approach to locate potential faults at layout level and calculate the relative probability of each fault. Our proposed method yields actionable results such as fault coverage of each test, potential faults, and probability of each fault. We show that the computational requirement can be significantly reduced by incorporating fault probabilities. These results can be used to improve fault coverage or to improve defect resilience of the circuit." @default.
• W2014417962 created "2016-06-24" @default.
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• W2014417962 date "2013-03-18" @default.
• W2014417962 modified "2023-10-12" @default.
• W2014417962 title "Fault analysis and simulation of large scale industrial mixed-signal circuits" @default.
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• W2014417962 doi "https://doi.org/10.5555/2485288.2485427" @default.
• W2014417962 hasPublicationYear "2013" @default.
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