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• W2014636890 abstract "Strain-compensated InGaAsP/InGaP superlattices are studied in cross section by atomic force microscopy and scanning tunneling microscopy. Undulations in the morphology of the {110} cross-sectional faces are observed, and are attributed to elastic relaxation of this surface due to underlying strain arising from thickness and compositional variations of the superlattice layers. Finite element computations are used to extract a quantitative measure of the strain variation." @default.
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• W2014636890 date "1998-04-06" @default.
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• W2014636890 title "Strain variations in InGaAsP/InGaP superlattices studied by scanning probe microscopy" @default.
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• W2014636890 doi "https://doi.org/10.1063/1.121165" @default.
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