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• W2014735296 abstract "Low frequency noise measurements (f<10Hz) are a powerful tool for the investigation of the quality and reliability of electron devices and material. In most cases, however, the application of this technique is made quite difficult both because of the effect of external interferences (temperature fluctuations, EMI, mechanical vibrations, etc.) and because of the high level of flicker noise of the commercial instrumentation. In this paper the most remarkable results we obtained by using low frequency noise measurements for the characterization of the reliability of VLSI metallic interconnections and thin oxides are resumed. Moreover, we discuss the effects of the several sources of noise and interferences which contribute to reduce the sensitivity of the measurement chain. In particular, we demonstrate that by means of a proper design, dedicated instrumentation can be built which allows for a considerable reduction of the overall background noise. Examples will be given with reference to voltage and transresistance amplifiers (both AC and DC coupled), to programmable biasing systems (both current and voltage sources), to thermal stabilization systems and to data acquisition systems. Finally, we will discuss methods which may allow, in proper conditions, to accurately measure noise levels well below the background noise of the input preamplifiers coupled to the device under test. As the systems we discuss are characterized by moderate complexity and employ components readily available on the market, we trust that this paper may also serve as a simple guideline to anyone interested in exploiting the possibility of using very low frequency noise measurements by building his own instrumentation." @default.
• W2014735296 created "2016-06-24" @default.
• W2014735296 creator A5009391545 @default.
• W2014735296 creator A5033822958 @default.
• W2014735296 date "2003-05-12" @default.
• W2014735296 modified "2023-10-16" @default.
• W2014735296 title "Low-frequency noise measurements: applications, methodologies and instrumentation" @default.
• W2014735296 cites W1545620787 @default.
• W2014735296 cites W1637089760 @default.
• W2014735296 cites W1913826519 @default.
• W2014735296 cites W1976028570 @default.
• W2014735296 cites W1982654370 @default.
• W2014735296 cites W1993499538 @default.
• W2014735296 cites W2000077830 @default.
• W2014735296 cites W2001607172 @default.
• W2014735296 cites W2032993063 @default.
• W2014735296 cites W2033945088 @default.
• W2014735296 cites W2042262773 @default.
• W2014735296 cites W2047356834 @default.
• W2014735296 cites W2050352771 @default.
• W2014735296 cites W2053524914 @default.
• W2014735296 cites W2072680704 @default.
• W2014735296 cites W2072805080 @default.
• W2014735296 cites W2083066482 @default.
• W2014735296 cites W2083577912 @default.
• W2014735296 cites W2097103835 @default.
• W2014735296 cites W2099885649 @default.
• W2014735296 cites W2105080370 @default.
• W2014735296 cites W2113189732 @default.
• W2014735296 cites W2114112542 @default.
• W2014735296 cites W2122456188 @default.
• W2014735296 cites W2132300802 @default.
• W2014735296 cites W2139006661 @default.
• W2014735296 cites W2139476244 @default.
• W2014735296 cites W2149041029 @default.
• W2014735296 cites W2149555935 @default.
• W2014735296 cites W2151195942 @default.
• W2014735296 cites W2153245079 @default.
• W2014735296 cites W2153816568 @default.
• W2014735296 cites W2168230289 @default.
• W2014735296 cites W2171973224 @default.
• W2014735296 cites W2532934857 @default.
• W2014735296 cites W376296709 @default.
• W2014735296 doi "https://doi.org/10.1117/12.489652" @default.
• W2014735296 hasPublicationYear "2003" @default.
• W2014735296 type Work @default.
• W2014735296 sameAs 2014735296 @default.
• W2014735296 citedByCount "6" @default.
• W2014735296 countsByYear W20147352962017 @default.
• W2014735296 countsByYear W20147352962022 @default.
• W2014735296 crossrefType "proceedings-article" @default.
• W2014735296 hasAuthorship W2014735296A5009391545 @default.
• W2014735296 hasAuthorship W2014735296A5033822958 @default.
• W2014735296 hasConcept C111919701 @default.
• W2014735296 hasConcept C112806910 @default.
• W2014735296 hasConcept C113873419 @default.
• W2014735296 hasConcept C115961682 @default.
• W2014735296 hasConcept C118530786 @default.
• W2014735296 hasConcept C119599485 @default.
• W2014735296 hasConcept C121332964 @default.
• W2014735296 hasConcept C127413603 @default.
• W2014735296 hasConcept C14245642 @default.
• W2014735296 hasConcept C154945302 @default.
• W2014735296 hasConcept C163258240 @default.
• W2014735296 hasConcept C163294075 @default.
• W2014735296 hasConcept C184892835 @default.
• W2014735296 hasConcept C194257627 @default.
• W2014735296 hasConcept C24326235 @default.
• W2014735296 hasConcept C2776257435 @default.
• W2014735296 hasConcept C29265498 @default.
• W2014735296 hasConcept C41008148 @default.
• W2014735296 hasConcept C43214815 @default.
• W2014735296 hasConcept C43461449 @default.
• W2014735296 hasConcept C62520636 @default.
• W2014735296 hasConcept C74342258 @default.
• W2014735296 hasConcept C76155785 @default.
• W2014735296 hasConcept C99498987 @default.
• W2014735296 hasConceptScore W2014735296C111919701 @default.
• W2014735296 hasConceptScore W2014735296C112806910 @default.
• W2014735296 hasConceptScore W2014735296C113873419 @default.
• W2014735296 hasConceptScore W2014735296C115961682 @default.
• W2014735296 hasConceptScore W2014735296C118530786 @default.
• W2014735296 hasConceptScore W2014735296C119599485 @default.
• W2014735296 hasConceptScore W2014735296C121332964 @default.
• W2014735296 hasConceptScore W2014735296C127413603 @default.
• W2014735296 hasConceptScore W2014735296C14245642 @default.
• W2014735296 hasConceptScore W2014735296C154945302 @default.
• W2014735296 hasConceptScore W2014735296C163258240 @default.
• W2014735296 hasConceptScore W2014735296C163294075 @default.
• W2014735296 hasConceptScore W2014735296C184892835 @default.
• W2014735296 hasConceptScore W2014735296C194257627 @default.
• W2014735296 hasConceptScore W2014735296C24326235 @default.
• W2014735296 hasConceptScore W2014735296C2776257435 @default.
• W2014735296 hasConceptScore W2014735296C29265498 @default.
• W2014735296 hasConceptScore W2014735296C41008148 @default.
• W2014735296 hasConceptScore W2014735296C43214815 @default.
• W2014735296 hasConceptScore W2014735296C43461449 @default.
• W2014735296 hasConceptScore W2014735296C62520636 @default.
• W2014735296 hasConceptScore W2014735296C74342258 @default.
• W2014735296 hasConceptScore W2014735296C76155785 @default.

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