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• W2015408518 abstract "An atomic force microscope has been used to study the electrical double layer interactions between a silicon tip (with an oxidised surface) and two polymeric membranes, one microfiltration (nominally 0.1 μm) and the other ultrfiltration (25 000 MWCO), in aqueous NaCl solutions. Force-distance curves were measured for the two membranes at four ionic strengths. The membranes were also imaged under the same conditions using electrical double layer repulsive forces of differing magnitudes —; “electrical double layer mode” imaging. Image analysis was used to determine surface pore size distributions. The force-distance curves, together with numerically calculated potential profiles at the entrance to a charged pore, allow an explanation and identification of the optimum imaging conditions. The best images were obtained at high ionic strength with the tip close to the membrane surface." @default.
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• W2015408518 date "1997-04-01" @default.
• W2015408518 modified "2023-09-23" @default.
• W2015408518 title "Atomic force microscope studies of membranes: force measurement and imaging in electrolyte solutions" @default.
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• W2015408518 doi "https://doi.org/10.1016/s0376-7388(96)00275-x" @default.
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