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- W2016996039 abstract "The impact of highly charged ions on freshly cleaved BaF2 (100) surfaces produces areas with a high amount of defects. In order to make these defect agglomerates visible, they are etched chemically and analysed with contact atomic force microscopy." @default.
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- W2016996039 date "2012-11-05" @default.
- W2016996039 modified "2023-09-23" @default.
- W2016996039 title "Defect formation on BaF<sub>2</sub>by single impact of highly charged ions" @default.
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