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- W2017093876 abstract "A multifrequency electron spin resonance study of the E'δ defect in six SiO2 glasses irradiated by UV, VUV, or 60Co γ-rays, points to an electronically rigid structure with no dynamic rearrangement occurring in the temperature range T⩾4.2 K. Reassuringly coinciding over all frequencies and T's applied, the average intensity ratio of the 100 G 29Si hyperfine doublet to the central Zeeman signal points to delocalization of the unpaired spin over n=4 or 5 equivalent Si sites, thus refuting the Si dimer model. A noteworthy revelation is that E'δ is only observed in those (3) silica types studied also showing the Al E' center in the as γ-irradiated state. This may signify some indirect role of charge compensators/traps in activating/stabilizing E'δ centers, relevant to further theoretical modeling." @default.
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- W2017093876 date "2011-01-01" @default.
- W2017093876 modified "2023-10-16" @default.
- W2017093876 title "Multi-frequency ESR analysis of the E′ δ defect hyperfine structure in SiO 2 glasses" @default.
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- W2017093876 doi "https://doi.org/10.1209/0295-5075/93/16002" @default.
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