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• W2017244546 abstract "The conduction-band offsets ΔEc of n-isotype InxAl1−xAs/In0.53Ga0.47As heterojunctions, with 0.47&lt;x≤0.52, grown by molecular-beam epitaxy, lattice matched and pseudomorphically strained on n+-InP substrates, were determined from the capacitance-voltage profiling technique. A more accurate ΔEc value was obtained after the correction for fixed interface charge perturbation. The ΔEc related to the band-gap difference ΔEgs of the heterojunction are found to be ΔEc=0.70ΔEgs. The fixed interface charges are acceptorlike with a density of the order 1010/cm2." @default.
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• W2017244546 date "1990-05-01" @default.
• W2017244546 modified "2023-09-27" @default.
• W2017244546 title "Conduction-band discontinuities of In<i>x</i>Al1−<i>x</i>As/In0.53Ga0.47As <i>n</i>-isotype heterojunctions" @default.
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• W2017244546 doi "https://doi.org/10.1063/1.344908" @default.
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