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- W2017307213 abstract "In this paper, a physical model is presented for estimating the mean intrinsic breakdown time of SiO 2 . Using a general compensation law and assuming that the current–voltage characteristic is dominated by modified Mott–Gurney hopping prior to breakdown, a simple analytical expression for predicting the mean intrinsic breakdown wearout lifetime of oxides can be obtained. The analytical results describe well the following features of the data, (1) a thermal acceleration factor which is a linear function of the stressing electric field and (2) a field acceleration factor that is proportional to reciprocal temperature. The existing closed form expression gives a good fit to experimentally obtained mean intrinsic breakdown time of oxides in the literature." @default.
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- W2017307213 date "2002-01-01" @default.
- W2017307213 modified "2023-10-01" @default.
- W2017307213 title "An analytical expression for predicting wearout lifetime of thin gate and tunneling oxide" @default.
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- W2017307213 doi "https://doi.org/10.1016/s0038-1101(01)00266-0" @default.
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