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- W2017494667 abstract "We demonstrate reduction of the free-carrier lifetime in a silicon nanowaveguide from 3 ns to 12.2 ps by applying a reverse bias across an integrated p-i-n diode. This observation represents the shortest free-carrier lifetime demonstrated to date in silicon waveguides. Importantly, the presence of the p-i-n structure does not measurably increase the propagation loss of the waveguide. We derive a figure of merit demonstrating equal dependency of the nonlinear phase shift on free-carrier lifetime and linear propagation loss." @default.
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- W2017494667 date "2010-02-04" @default.
- W2017494667 modified "2023-10-10" @default.
- W2017494667 title "Ultrashort free-carrier lifetime in low-loss silicon nanowaveguides" @default.
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- W2017494667 doi "https://doi.org/10.1364/oe.18.003582" @default.
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