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- W2017707466 abstract "Design for next generation DRAM on early development stage should be concerned about the intrinsic reliability margins and maximum Burn-in stress voltage. This paper proposes that BI stress voltage, when latent defects could not be evaluated by burn-in to obtain the acceleration parameters, is decided by the increasing ratio of historical burn-in stress voltage trend." @default.
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- W2017707466 date "2010-01-01" @default.
- W2017707466 modified "2023-10-14" @default.
- W2017707466 title "Method of deciding burn-in stress voltage in conceptual design phase" @default.
- W2017707466 doi "https://doi.org/10.1109/irps.2010.5488686" @default.
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