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- W2017939718 abstract "Silicon surfaces may be covered with hydrogen by adsorption of atomic hydrogen and by wet chemical etching. The adsorption of hydrogen induces additional surface dipoles and new surface states. The occupied H-induced surface states are below the valence-band maximum so that the bands should be flat up to the surface. However, after H-termination by wet chemical etching the Fermi level is pinned close to midgap position for n- and p-type bulk doping. This behavior is not caused by any kind of defect states but was explained by a passivation of shallow impurities due to an incorporation of hydrogen from the etching solution. Capacitance–voltage characteristics of lead contacts on H-terminated silicon samples demonstrate a penetration of hydrogen up to 1 μm below the interface. In comparison to what is observed with clean interfaces hydrogen-doping reduces the barrier heights of metal–p-diamond contacts but increases it at Pb–p-silicon interfaces. Hydrogen-induced interface dipoles explain this behavior. They are oppositely oriented at diamond and silicon interfaces since hydrogen is more electronegative than silicon but electropositive compared to carbon." @default.
- W2017939718 created "2016-06-24" @default.
- W2017939718 creator A5038776526 @default.
- W2017939718 date "1997-01-01" @default.
- W2017939718 modified "2023-09-27" @default.
- W2017939718 title "Hydrogen-Modification of Electronic Surface, Bulk, and Interface Properties of Si" @default.
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- W2017939718 doi "https://doi.org/10.1002/1521-396x(199701)159:1<25::aid-pssa25>3.0.co;2-c" @default.
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