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• W2018019336 abstract "Abstract Various metal–insulator–semiconductor (MIS) devices in the form of Au/SiO x ( x y ( y x /ZnO and Au/AlO y /ZnO have been fabricated. For each device, once a sufficiently high positive voltage is applied on the Au electrode, the same ultraviolet (UV) emission with a spectrum featuring several specific peaks is detected. Interestingly, such UV emissions related to the MIS devices originate from the external N 2 microplasma. It is believed that at the high enough positive voltages the highly energetic electrons emitted out of the Au electrode activate the air to generate the N 2 microplasma." @default.
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• W2018019336 date "2010-06-01" @default.
• W2018019336 modified "2023-09-26" @default.
• W2018019336 title "Ultraviolet light emissions from N2 microplasma electrically induced by metal–insulator–semiconductor devices" @default.
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• W2018019336 doi "https://doi.org/10.1016/j.jlumin.2010.01.027" @default.
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