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- W2019967016 abstract "Arp Analytical Plotter Attachment for the Reflex MicroscopeP.J. Scott and C.J. WonnacottReflex Measurement Ltd., 9 Whitehall Park, London N19 STSAbstractA new development is described which allows the Reflex Microscope to be adapted as astereo plotter for measuring from pairs of photographs. A software suite is beingimplemented on a microcomputer.IntroductionThe advantage of the Reflex Microscope over photogrammetry is that observations aremade directly on the object with no photography, photographic distortion or photogrammetricreconstruction. Its limitations are that the object must be (i) stationary, (ii) availableand (iii) small. There is thus a compelling reason for developing the modificationdescribed here, which allows the Microscope to be converted quickly into an analyticalstereo -plotter, which can measure from stereoscopic photographs of a large building or amoving animal or a museum specimen which cannot be brought to the Microscope.Mechanical and Optical Modifications requiredThe Reflex Microscope1'2 is similar to stereo-photogrammetry in operation: the operatorguides a virtual measuring mark around a three -- dimensional model. In photogrammetry themodel is created in the observer's mind from a pair of two -dimensional projective views(photographs). In the Microscope the object is viewed directly, from two slightly differentview points, down the two separate light paths of the stereoscopic binocular viewing head.A single light spot is reflected into both light paths.It is possible to direct the two light paths outside the Microscope, as shown in Figure" @default.
- W2019967016 created "2016-06-24" @default.
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- W2019967016 date "1986-07-07" @default.
- W2019967016 modified "2023-09-23" @default.
- W2019967016 title "An Analytical Plotter Attachment for the Reflex Microscope" @default.
- W2019967016 doi "https://doi.org/10.1117/12.956290" @default.
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