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- W2019968486 abstract "Atomic force microscopy has been used to study the surface structure and roughness of PECVD silicon nitride coated silicon solar cells. The surface roughness increases in some areas of the solar cells after forming gas annealing. It may be one of the reasons for better light absorption on the surface of the solar cells resulting in better solar cell performance." @default.
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- W2019968486 date "1995-07-01" @default.
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- W2019968486 title "Atomic force microscopy study of FG-annealed and PECVD silicon nitride AR-coated silicon solar cells" @default.
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- W2019968486 doi "https://doi.org/10.1016/0960-1481(95)00054-n" @default.
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