Matches in SemOpenAlex for { <https://semopenalex.org/work/W2020126529> ?p ?o ?g. }
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- W2020126529 endingPage "1239" @default.
- W2020126529 startingPage "1230" @default.
- W2020126529 abstract "Electron field emission from broad-area metal surfaces is known to occur at a much lower electric field than predicted by the Fowler–Nordheim law. This enhanced field emission (EFE) presents a major impediment to high electric field operation in a variety of applications, e.g., in superconducting niobium radio-frequency cavities for particle accelerators, klystrons, and a wide range of high-voltage vacuum devices. Therefore, EFE has widely been the subject of fundamental research for years. Although micron or submicron particles are often observed at such EFE sites, the strength and number of emitting sites and the causes of EFE depend strongly on surface preparation and handling. Furthermore, the physical mechanism of EFE remains unknown. To systematically investigate the sources of this emission and to evaluate the best available surface preparation techniques with respect to the resulting field emission, a dc scanning field emission microscope (SFEM) was built at the Thomas Jefferson National Accelerator Facility (Jefferson Laboratory). Broad-area samples can be moved laterally in a raster pattern (2.5 μm step resolution) under a high-voltage microtip for EFE detection and localization in the SFEM. The emitting sites can then be characterized by scanning electron microscopy and energy dispersive x-ray spectrometry without breaking ultrahigh vacuum. After preparation by chemical etching and electropolishing combined with ultrasonic deionized water rinse, EFE sources from planar Nb have been studied. Emitters have been identified and analyzed, and based on scan results the preparation process has been refined and improved. With the improved preparation process, field-emission-free or near-field-emission-free surfaces at ∼140 MV/m have been achieved consistently on a number of samples." @default.
- W2020126529 created "2016-06-24" @default.
- W2020126529 creator A5018789054 @default.
- W2020126529 creator A5053048713 @default.
- W2020126529 creator A5069637939 @default.
- W2020126529 date "2003-06-16" @default.
- W2020126529 modified "2023-09-26" @default.
- W2020126529 title "Enhanced field emission from chemically etched and electropolished broad-area niobium" @default.
- W2020126529 cites W1965157015 @default.
- W2020126529 cites W1983361667 @default.
- W2020126529 cites W1990132155 @default.
- W2020126529 cites W2002924334 @default.
- W2020126529 cites W2035573863 @default.
- W2020126529 cites W2076082591 @default.
- W2020126529 cites W2085246516 @default.
- W2020126529 cites W2161606023 @default.
- W2020126529 doi "https://doi.org/10.1116/1.1574047" @default.
- W2020126529 hasPublicationYear "2003" @default.
- W2020126529 type Work @default.
- W2020126529 sameAs 2020126529 @default.
- W2020126529 citedByCount "9" @default.
- W2020126529 countsByYear W20201265292019 @default.
- W2020126529 countsByYear W20201265292020 @default.
- W2020126529 countsByYear W20201265292021 @default.
- W2020126529 crossrefType "journal-article" @default.
- W2020126529 hasAuthorship W2020126529A5018789054 @default.
- W2020126529 hasAuthorship W2020126529A5053048713 @default.
- W2020126529 hasAuthorship W2020126529A5069637939 @default.
- W2020126529 hasBestOaLocation W20201265292 @default.
- W2020126529 hasConcept C100460472 @default.
- W2020126529 hasConcept C120665830 @default.
- W2020126529 hasConcept C121029787 @default.
- W2020126529 hasConcept C121332964 @default.
- W2020126529 hasConcept C147120987 @default.
- W2020126529 hasConcept C159985019 @default.
- W2020126529 hasConcept C171250308 @default.
- W2020126529 hasConcept C191897082 @default.
- W2020126529 hasConcept C192562407 @default.
- W2020126529 hasConcept C207114421 @default.
- W2020126529 hasConcept C26771246 @default.
- W2020126529 hasConcept C2779227376 @default.
- W2020126529 hasConcept C49040817 @default.
- W2020126529 hasConcept C507968137 @default.
- W2020126529 hasConcept C62520636 @default.
- W2020126529 hasConcept C97404965 @default.
- W2020126529 hasConceptScore W2020126529C100460472 @default.
- W2020126529 hasConceptScore W2020126529C120665830 @default.
- W2020126529 hasConceptScore W2020126529C121029787 @default.
- W2020126529 hasConceptScore W2020126529C121332964 @default.
- W2020126529 hasConceptScore W2020126529C147120987 @default.
- W2020126529 hasConceptScore W2020126529C159985019 @default.
- W2020126529 hasConceptScore W2020126529C171250308 @default.
- W2020126529 hasConceptScore W2020126529C191897082 @default.
- W2020126529 hasConceptScore W2020126529C192562407 @default.
- W2020126529 hasConceptScore W2020126529C207114421 @default.
- W2020126529 hasConceptScore W2020126529C26771246 @default.
- W2020126529 hasConceptScore W2020126529C2779227376 @default.
- W2020126529 hasConceptScore W2020126529C49040817 @default.
- W2020126529 hasConceptScore W2020126529C507968137 @default.
- W2020126529 hasConceptScore W2020126529C62520636 @default.
- W2020126529 hasConceptScore W2020126529C97404965 @default.
- W2020126529 hasIssue "4" @default.
- W2020126529 hasLocation W20201265291 @default.
- W2020126529 hasLocation W20201265292 @default.
- W2020126529 hasLocation W20201265293 @default.
- W2020126529 hasOpenAccess W2020126529 @default.
- W2020126529 hasPrimaryLocation W20201265291 @default.
- W2020126529 hasRelatedWork W123094261 @default.
- W2020126529 hasRelatedWork W2002924334 @default.
- W2020126529 hasRelatedWork W2037064921 @default.
- W2020126529 hasRelatedWork W2039641765 @default.
- W2020126529 hasRelatedWork W2048147006 @default.
- W2020126529 hasRelatedWork W2087437752 @default.
- W2020126529 hasRelatedWork W2091795916 @default.
- W2020126529 hasRelatedWork W2130396172 @default.
- W2020126529 hasRelatedWork W2154709280 @default.
- W2020126529 hasRelatedWork W265874331 @default.
- W2020126529 hasVolume "21" @default.
- W2020126529 isParatext "false" @default.
- W2020126529 isRetracted "false" @default.
- W2020126529 magId "2020126529" @default.
- W2020126529 workType "article" @default.