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• W2021158214 abstract "In this work, standard and nanoscale experiments have been combined to investigate the electrical properties of metal-oxide-semiconductor (MOS) memory devices with silicon nanocrystals (Si-nc) embedded in the gate oxide. The nanometer scale analysis has been performed with a conductive atomic force microscope (C-AFM) which, thanks to its high lateral resolution, allows the study of areas of only few hundreds of nm2. Therefore, with this technique, a very reduced number of Si-nc can be investigated. We have studied the conduction mechanisms, the retention time, and the amount of charge stored in the Si-nc of these structures. The results have demonstrated that Si-nc enhance the gate oxide electrical conduction due to trap assisted tunneling. On the other hand, Si-nc can act as trapping sites. The amount of charge stored in Si-nc has been estimated through the change induced in the barrier height measured from the current-voltage (I-V) curves (at the nanoscale, with C-AFM) and from the flat band voltage shift determined from the capacitance-voltage (C-V) characteristics measured on polygated structures. Both procedures have shown an occupation level of ∼20% of the Si-nc. The retention times, estimated at the nanoscale and from standard electrical characterization, are consistent. Moreover, contrary to standard characterization techniques, C-AFM allows the mesurement of lateral leakage currents in memories based on high density trapping sites. All these results allow one to conclude that C-AFM is a very suitable tool in performing a detailed investigation of the performance of memory devices based on MOS structures with Si-nc at the nanoscale." @default.
• W2021158214 created "2016-06-24" @default.
• W2021158214 creator A5001755889 @default.
• W2021158214 creator A5010419052 @default.
• W2021158214 creator A5040787826 @default.
• W2021158214 creator A5048192935 @default.
• W2021158214 creator A5058680153 @default.
• W2021158214 creator A5064836498 @default.
• W2021158214 creator A5073132196 @default.
• W2021158214 date "2007-03-15" @default.
• W2021158214 modified "2023-10-17" @default.
• W2021158214 title "Nanoscale electrical characterization of Si-nc based memory metal-oxide-semiconductor devices" @default.
• W2021158214 cites W1645279136 @default.
• W2021158214 cites W1963784575 @default.
• W2021158214 cites W1968277069 @default.
• W2021158214 cites W1977755543 @default.
• W2021158214 cites W1984512164 @default.
• W2021158214 cites W1987664266 @default.
• W2021158214 cites W1997212947 @default.
• W2021158214 cites W2008100644 @default.
• W2021158214 cites W2008530055 @default.
• W2021158214 cites W2011089178 @default.
• W2021158214 cites W2017377056 @default.
• W2021158214 cites W2021122851 @default.
• W2021158214 cites W2031264256 @default.
• W2021158214 cites W2033157298 @default.
• W2021158214 cites W2037443297 @default.
• W2021158214 cites W2051759825 @default.
• W2021158214 cites W2057803771 @default.
• W2021158214 cites W2069963014 @default.
• W2021158214 cites W2077326934 @default.
• W2021158214 cites W2082883647 @default.
• W2021158214 cites W2082886165 @default.
• W2021158214 cites W2084454069 @default.
• W2021158214 cites W2087264597 @default.
• W2021158214 cites W2096285656 @default.
• W2021158214 cites W2121136838 @default.
• W2021158214 cites W2161606023 @default.
• W2021158214 cites W2168012376 @default.
• W2021158214 cites W2294398660 @default.
• W2021158214 doi "https://doi.org/10.1063/1.2433749" @default.
• W2021158214 hasPublicationYear "2007" @default.
• W2021158214 type Work @default.
• W2021158214 sameAs 2021158214 @default.
• W2021158214 citedByCount "26" @default.
• W2021158214 countsByYear W20211582142012 @default.
• W2021158214 countsByYear W20211582142013 @default.
• W2021158214 countsByYear W20211582142014 @default.
• W2021158214 countsByYear W20211582142015 @default.
• W2021158214 crossrefType "journal-article" @default.
• W2021158214 hasAuthorship W2021158214A5001755889 @default.
• W2021158214 hasAuthorship W2021158214A5010419052 @default.
• W2021158214 hasAuthorship W2021158214A5040787826 @default.
• W2021158214 hasAuthorship W2021158214A5048192935 @default.
• W2021158214 hasAuthorship W2021158214A5058680153 @default.
• W2021158214 hasAuthorship W2021158214A5064836498 @default.
• W2021158214 hasAuthorship W2021158214A5073132196 @default.
• W2021158214 hasConcept C102951782 @default.
• W2021158214 hasConcept C108225325 @default.
• W2021158214 hasConcept C120398109 @default.
• W2021158214 hasConcept C139719470 @default.
• W2021158214 hasConcept C159985019 @default.
• W2021158214 hasConcept C162324750 @default.
• W2021158214 hasConcept C171250308 @default.
• W2021158214 hasConcept C18903297 @default.
• W2021158214 hasConcept C191897082 @default.
• W2021158214 hasConcept C192562407 @default.
• W2021158214 hasConcept C206008964 @default.
• W2021158214 hasConcept C2777042071 @default.
• W2021158214 hasConcept C2777924906 @default.
• W2021158214 hasConcept C2779851234 @default.
• W2021158214 hasConcept C2780841128 @default.
• W2021158214 hasConcept C45206210 @default.
• W2021158214 hasConcept C49040817 @default.
• W2021158214 hasConcept C544956773 @default.
• W2021158214 hasConcept C77066764 @default.
• W2021158214 hasConcept C86803240 @default.
• W2021158214 hasConceptScore W2021158214C102951782 @default.
• W2021158214 hasConceptScore W2021158214C108225325 @default.
• W2021158214 hasConceptScore W2021158214C120398109 @default.
• W2021158214 hasConceptScore W2021158214C139719470 @default.
• W2021158214 hasConceptScore W2021158214C159985019 @default.
• W2021158214 hasConceptScore W2021158214C162324750 @default.
• W2021158214 hasConceptScore W2021158214C171250308 @default.
• W2021158214 hasConceptScore W2021158214C18903297 @default.
• W2021158214 hasConceptScore W2021158214C191897082 @default.
• W2021158214 hasConceptScore W2021158214C192562407 @default.
• W2021158214 hasConceptScore W2021158214C206008964 @default.
• W2021158214 hasConceptScore W2021158214C2777042071 @default.
• W2021158214 hasConceptScore W2021158214C2777924906 @default.
• W2021158214 hasConceptScore W2021158214C2779851234 @default.
• W2021158214 hasConceptScore W2021158214C2780841128 @default.
• W2021158214 hasConceptScore W2021158214C45206210 @default.
• W2021158214 hasConceptScore W2021158214C49040817 @default.
• W2021158214 hasConceptScore W2021158214C544956773 @default.
• W2021158214 hasConceptScore W2021158214C77066764 @default.
• W2021158214 hasConceptScore W2021158214C86803240 @default.
• W2021158214 hasIssue "6" @default.
• W2021158214 hasLocation W20211582141 @default.
• W2021158214 hasOpenAccess W2021158214 @default.

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