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• W2021676362 abstract "We present an analytical modeling of the noise temperature associated with velocity fluctuations obtained in the framework of the linear‐response theory around a steady state. The expressions are rigorously related to an eigenvalue expansion of the response matrix and are applicable to ohmic as well as to nonohmic (hot‐carrier) conditions. Theory requires as input parameters the reciprocal carrier effective mass, the drift velocity, the carrier energy, the variance of velocity fluctuations, and the covariance of velocity‐energy fluctuations as functions of the electric field in stationary and homogeneous conditions. The analytical results obtained for the case of holes in Si and electrons in GaAs at T=300 K are validated by comparison with experiments." @default.
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• W2021676362 date "1996-11-01" @default.
• W2021676362 modified "2023-09-26" @default.
• W2021676362 title "A model noise temperature for nonlinear transport in semiconductors" @default.
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• W2021676362 doi "https://doi.org/10.1063/1.363485" @default.
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